SCANNING ELECTRON MICROSCOPY
ZEISS GeminiSEM 300 with EDX detector from Oxford Instruments
Field Emission SEM for high contrast, low voltage images from any sample.
Crisp images with sub-nanometer resolution are acquired with minimum sample damage, even for challenging non-conductive samples.
The integrated EDX detector from Oxford Instruments combined with the AZtec system provides Real-time elemental analysis at the nano-scale. Moreover, the Feature software allow user friendly and high-speed particles analysis, ideal for automated applications.