SCANNING ELECTRON MICROSCOPY

ZEISS GeminiSEM 300 with EDX detector from Oxford Instruments

Field Emission SEM for high contrast, low voltage images from any sample.

Crisp images with sub-nanometer resolution are acquired with minimum sample damage, even for challenging non-conductive samples.

The integrated EDX detector from Oxford Instruments combined with the AZtec system provides Real-time elemental analysis at the nano-scale.  Moreover, the Feature software allow user friendly and high-speed particles analysis, ideal for automated applications.

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